| 41. Metrology | |
| 41.05.+l | Quantum limits |
| 41.10.+p | Quantum enhanced position measurements |
| 41.20.+c | Quantum clock synchronization |
| 41.30.+i | Quantum imaging |
| 41.40.+s | Precision spectroscopy via entangled states |
| 41.50.+n | Nanomechanical sensors |
| 41.60.+s | Single electron spin measurements |
| 41.70.+a | Aligning reference frames |
| 41.80.+c | Absolute calibration of detectors |
| 41.90.+n | New sensor technologies |
| 41.95.+m | Quantum magnetometry |
| 42. QIP-related Technologies | |
| 42.10.+p | Photonic crystal microcavities |
| 42.20.+i | Integrated atom optical elements |
| 42.25.+w | Quantum wires |
| 42.30.+l | New laser sources |
| 42.35.+o | Optoelectronics devices |
| 42.40.+s | Spintronics |
| 42.45.+u | Nanostructures |
| 42.50.+n | Nanomechanical devices |
| 42.60.+t | Miniaturized trap technologies |
| 42.70.-t | Nanotransitors |
| 42.70.Se | Single electron transistors |
| 42.70.Cp | Cooper pair transistor |
| 42.80.+l | Quantum lithography |
| 42.90.+o | Solid-state optical switches |

