quantum metrology

Dates: 

Monday, December 7, 2020 to Wednesday, December 9, 2020

Submission deadline: 

Sunday, November 15, 2020

Registration deadline: 

Wednesday, December 9, 2020

AQIS ’20 will focus on quantum information processing, communication and cryptography, an interdisciplinary field bridging quantum physics, computer science, mathematics, and information technologies. AQIS’20 will be a natural successor of EQIS’01-EQIS’05 and AQIS’06-AQIS’19. AQIS’20 will consist of invited talks, and selected oral and poster presentations.

Since 1990, the volt has been defined using superconducting devices called Josephson junctions. The DC voltage across a Josephson junction is related only via fundamental constants to the frequency of an applied microwave signal. As existing microwave sources have frequency stability well below one part-per-billion (ppb), so is the precision of the Josephson voltage standard.

Postdoctoral Research Fellow in Optical Quantum Information Processing

Quantum Information Science Group, Department of Physics and Astronomy
Seoul National University, Seoul, Korea

The Quantum Information and Computation Initiative (QICI) of the Computer Science Department at The University of Hong Kong (HKU) invites applications for PhD Fellowships for the academic year 2021/2022.

QICI is home to a vibrant research community, organised in two research groups led by Professors Giulio Chiribella and Ravi Ramanathan. We support an open research culture, where original thinking and academic merit are encouraged and nurtured.

The mission of QICI is to promote the growth of the quantum information area in Hong Kong, and to develop Hong Kong as an international research hub for quantum information and computation.

QICI has been established in November 2018 under the auspices of the HKU Department of Computer Science. Its research platform consists of 3 research teams working on quantum information theory, quantum cryptography, quantum gravity, and quantum foundations.

Pages

Subscribe to RSS - quantum metrology